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Ortak Dersler Bölümü

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Browsing Ortak Dersler Bölümü by Institution Author "Guler, I."

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    Citation - WoS: 5
    Citation - Scopus: 5
    Characterization of N Rich-Silicon Nitride Thin Films Deposited by Pecvd
    (Electrochemical Soc inc, 2023) Guler, I.
    Silicon nitride thin films are very important for their possible use in semiconductor industry and electronic applications. Changing the deposition parameters, silicon nitrides which have many varying optical properties can be produced. In this work, silicon nitride (SiNx) thin films were deposited on silicon substrates using Plasma enhanced chemical vapor deposition (PECVD) technique. The silane (SiH4) and ammonia (NH3) were used as reactant gases. Using these reactant gases, nitrogen (N) rich SiNx films were obtained. In order to get information about absorption and bond types in the films, films were analyzed by the help of Fourier transform infrared spectroscopy (FTIR) was performed. The refractive index, extinction coefficient and band gap energy of the films were changed from 1.86, 0 and 5.38 eV to 2.05, 0.0048 and 4.26 eV, respectively. Using the refractive index, composition of the films were estimated that is [N]/[Si] ratio of the films varied from 1.38 to 1.62. For possible applications of the SiNx films, learning the origin of the light-emission of the films is very important so the photoluminescence (PL) measurements were also used to see the luminescent of the SiNx films which is related to the electronic transitions between the K-center level and the conduction band tail states.
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    Citation - WoS: 9
    Optical Analysis of Tlins2xse2(1-X) Mixed Crystals
    (Amer inst Physics, 2014) Guler, I.
    The ellipsometry measurements were carried out on TlInS2xSe2(1-x) mixed crystals in the spectral range of 1.5-6.0 eV at room temperature. The refractive index, extinction coefficient, real and imaginary parts of dielectric function were found as a result of ellipsometric measurements. The energies of interband transitions (critical point energies) of the TlInS2xSe2(1-x) mixed crystals were obtained by means of the second derivative of the real and imaginary parts of dielectric function. The variation of the critical point energies with the isomorphic anion substitution that is sulfur for selenium atoms was established. (C) 2014 AIP Publishing LLC.