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Choosing Parameters To Achieve a Higher Success Rate for Hellman Time Memory Trade Off Attack

dc.contributor.author Saran, Nurdan
dc.contributor.author Doganaksoy, Ali
dc.date.accessioned 2020-04-02T20:01:58Z
dc.date.accessioned 2025-09-18T13:26:03Z
dc.date.available 2020-04-02T20:01:58Z
dc.date.available 2025-09-18T13:26:03Z
dc.date.issued 2009
dc.description.abstract In 1980, Hellman proposed the Time Memory Trade Off (TWTO) attack and applied it on block cipher DES (Data Encryption Standard). Time Memory Trade Off attack is one of the methods that inverts a one way function. The resistance to TWO attacks is an important criterion in the design of a modern cipher Unlike the exhaustive search and table lookup methods, TWO is a probabilistic method, that is, the search operation may not find a preimage even if there exists one. Up to now, there are some approximate bounds for success rates of Hellman table by Hellman and Kusuda et al. In this study, we give a more precise approximation for the coverage of a single Hellman table. There is no precise guideline in the literature that points out how to choose parameters for Hellman TWO. We present a detailed analysis of the success rate of Hellman table via new parameters and also show how to choose parameters to achieve a higher success rate. The results are experimentally confirmed. We also discuss the Hellman's TMTO Curve. en_US
dc.identifier.citation Saran, Nurdan; Doğanaksoy, Ali, "Choosing parameters to achieve a higher success rate for hellman time memory trade off attack", 2009 International Conference On Availability, Reliability, And Security (Ares), Vols 1 And 2, (2009). en_US
dc.identifier.doi 10.1109/ARES.2009.140
dc.identifier.isbn 9781424435722
dc.identifier.scopus 2-s2.0-70349669575
dc.identifier.uri https://doi.org/10.1109/ARES.2009.140
dc.identifier.uri https://hdl.handle.net/20.500.12416/12493
dc.language.iso en en_US
dc.publisher Ieee en_US
dc.relation.ispartof 4th International Conference on Availability, Reliability and Security -- MAR 16-19, 2009 -- Fukuoka Inst Technol, Fukuoka, JAPAN en_US
dc.rights info:eu-repo/semantics/closedAccess en_US
dc.subject Symmetric Key Cryptography en_US
dc.subject Cryptanalysis en_US
dc.subject Time Memory Trade Off Attack en_US
dc.subject Success Probability en_US
dc.title Choosing Parameters To Achieve a Higher Success Rate for Hellman Time Memory Trade Off Attack en_US
dc.title Choosing parameters to achieve a higher success rate for hellman time memory trade off attack tr_TR
dc.type Conference Object en_US
dspace.entity.type Publication
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gdc.author.wosid Saran, Nurdan/Izq-0124-2023
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gdc.description.department Çankaya University en_US
gdc.description.departmenttemp [Saran, Nurdan] Cankaya Univ, Dept Comp Engn, Ankara, Turkey; [Doganaksoy, Ali] METU, Dept Math, Ankara, Turkey en_US
gdc.description.publicationcategory Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı en_US
gdc.description.woscitationindex Conference Proceedings Citation Index - Science
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gdc.oaire.sciencefields 0202 electrical engineering, electronic engineering, information engineering
gdc.oaire.sciencefields 0102 computer and information sciences
gdc.oaire.sciencefields 02 engineering and technology
gdc.oaire.sciencefields 01 natural sciences
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gdc.opencitations.count 5
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gdc.virtual.author Saran, Ayşe Nurdan
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