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Model analytics for defect prediction based on design-level metrics and sampling techniques

dc.contributor.author Kaya, Aydın
dc.contributor.author Keçeli, Ali Seydi
dc.contributor.author Çatal, Çağatay
dc.contributor.author Tekinerdoğan, Bedir
dc.date.accessioned 2021-06-10T11:33:45Z
dc.date.available 2021-06-10T11:33:45Z
dc.date.issued 2020
dc.description.abstract Predicting software defects in the early stages of the software development life cycle, such as the design and requirement analysis phase, provides significant economic advantages for software companies. Model analytics for defect prediction lets quality assurance groups build prediction models earlier and predict the defect-prone components before the testing phase for in-depth testing. In this study, we demonstrate that Machine Learning-based defect prediction models using design-level metrics in conjunction with data sampling techniques are effective in finding software defects. We show that design-level attributes have a strong correlation with the probability of defects and the SMOTE data sampling approach improves the performance of prediction models. When design-level metrics are applied, the Adaboost ensemble method provides the best performance to detect the minority class samples. en_US
dc.identifier.citation Kaya, Aydın...et al (2020). "Model analytics for defect prediction based on design-level metris and sampling techniques", Model Management and Analytics for Large Scale Systems, Academic Press, 2020, pp. 125-139. en_US
dc.identifier.doi 10.1016/B978-0-12-816649-9.00015-6
dc.identifier.isbn 9780128166499
dc.identifier.uri https://hdl.handle.net/20.500.12416/4759
dc.language.iso en en_US
dc.publisher Academic Press en_US
dc.relation.ispartof Model Management and Analytics for Large Scale Systems en_US
dc.rights info:eu-repo/semantics/closedAccess en_US
dc.subject Defect Prediction en_US
dc.subject Design-Level Metrics en_US
dc.subject Sampling Techniques en_US
dc.subject Software Defects en_US
dc.subject Model Analytics en_US
dc.title Model analytics for defect prediction based on design-level metrics and sampling techniques tr_TR
dc.title Model Analytics for Defect Prediction Based on Design-Level Metrics and Sampling Techniques en_US
dc.type Book Part en_US
dspace.entity.type Publication
gdc.author.yokid 3530
gdc.bip.impulseclass C4
gdc.bip.influenceclass C5
gdc.bip.popularityclass C4
gdc.coar.access metadata only access
gdc.coar.type text::book::book part
gdc.collaboration.industrial false
gdc.description.department Çankaya Üniversitesi, Mühendislik Fakültesi, Bilgisayar Mühendisliği Bölümü en_US
gdc.description.endpage 139 en_US
gdc.description.startpage 125 en_US
gdc.identifier.openalex W2974243782
gdc.oaire.diamondjournal false
gdc.oaire.impulse 6.0
gdc.oaire.influence 2.8348455E-9
gdc.oaire.isgreen false
gdc.oaire.keywords Life Science
gdc.oaire.popularity 6.0832273E-9
gdc.oaire.publicfunded false
gdc.openalex.collaboration International
gdc.openalex.fwci 2.6046
gdc.openalex.normalizedpercentile 0.9
gdc.openalex.toppercent TOP 10%
gdc.opencitations.count 7
gdc.plumx.mendeley 15
gdc.plumx.scopuscites 7
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relation.isOrgUnitOfPublication.latestForDiscovery 0b9123e4-4136-493b-9ffd-be856af2cdb1

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